KNMF

Technology portfolio and Expert know-how

KNMF offers a unique and dedicated set of state-of-the-art technologies for structuring and characterising a multitude of functional materials at the micro- and nanoscale. Our technology portfolio is subject to continuous improvement to offer our users the newest state-of-the-art technologies to ensure the competitive edge. The technologies labelled in grey are subject to major investments and are coming soon.

Our technology experts support all users, either potential or actual, in all questions relating to the access and use of our technologies. It is recommended to select and contact the experts of the technologies of interest prior to a proposal submission. The user office will assist you to find the most appropriate technology experts. Upon proposal permission the responsible technology experts will serve as local contacts. They accompany you to reach your personal goals. This may include conducting processes at the laboratories or organising overall workflows for your own project.

We invite you to read more about our technologies and experts by downloading the descriptions.

 

Micro- and Nanostructuring

» Electron beam lithography

» Deep x-ray lithography

» Laser material processing

» Injection moulding

» Hot embossing

» Focused ion beam

» Dip-pen nanolithography

» Thin film technologies

Atomic layer deposition

Dry etching cluster

Nanoimprint lithography

 

Microscopy and Spectroscopy

» Scanning electron microscopy

» Transmission electron microscopy

» X-ray photoelectron spectroscopy

» Auger electron microscopy

» Bulk and trace analysis of nanomaterials

» Electron micro-probe analysis

» Laser ablation ICPMS

» Thin film characterisation methods

Scanning probe technologies

Atom probe tomography

NMR spectroscopy

Atomic force microscopy cluster

 

Synchrotron Characterisation

» Cluster for in situ synthesis, processing and characterization of thin films and nanostructured interfaces and surfaces

» Hard x-ray microscopy and 3D tomographic imaging
» High resolution synchrotron small angle x-ray scattering (SAXS)
» Infrared micro and nanospectroscopy

» In-situ powder diffraction
» Laboratory diffractometry under non-ambient conditions

» Soft x-ray spectroscopy, microscopy, and spectromicroscopy