Workshop on 3D FIB-SEM

  • Place:

    KIT Campus North, Karlsruhe, Germany

  • Date:

    23 October 2018

  • As part of the VIP+ project "REconstruction of POrous Structures from FIB-SEM images" (REPOS), founded by the ministry for science and education (BMBF),  we invite you to join our workshop on 3D FIB-SEM imaging & analysis at KIT Campus North. The focus of the workshop will be on acquisition of 3D slice&view stacks, alignment and segmentation of FIB slice&view data sets with emphasis on porous materials.

    Online registration is required: Registration Link.

    Note: On October 24th & 25th we will further organize a workshop on electron tomography in materials science at KIT Campus North: Registration and detailed program.

    Contact

    Dr. Christian Kübel
    Karlsruhe Institute of Technology (KIT)
    Institute of Nanotechnology (INT)
    Hermann-von-Helmholtz-Platz 1
    76344 Eggenstein-Leopoldshafen
    Germany
    Phone: +49 (721) 608-28970
    E-mail: christian.kuebel@kit.edu

    Venue

    KIT Campus North
    Institute of Nanotechnology (INT – Building 640, Room 0-167)
    Hermann-von-Helmholtz Platz 1
    76344 Eggenstein-Leopoldshafen
    Germany

    Agenda

    09:15     Welcome

    09:30     3D FIB, Marco Cantoni, CIME, Ecole Polytechnique Fédérale de Lausanne

    10:15     Alignment of FIB-SEM stacks - desired and undesired effects, Diego Roldan, Fraunhofer ITWM

    10:45     Coffee Break

    11:15     Decurtaining of FIB-SEM images, Nikita Nobel, Fraunhofer ITWM

    11:45     Stochastic microstructure modeling of FIB-SEM data representing hierarchically structured electrodes, Matthias Neumann, Ulm University

    12:30     Lunch & Poster Session

    13:30     Helium Ion Microscopy, Ruth Schwaiger, KIT

    14:15     Multi-scale analysis, modelling, and simulation of a nano-porous membrane, Katja Schladitz, Fraunhofer ITWM

    14:45     Quantitative analysis of electron tomography data sets, Christian Kübel, KIT

    15:15     Coffee Break

    15:45     Advances in FIB tomography – answering the need of high resolution, multi-scale and multi-modal subsurface characterization, Anna Prokhodtseva, FEI

    16:15     3D FIB-SEM, Fabian Perez-Willard, Zeiss

    17:00     Lab Tour Karlsruhe Nano Micro Facility