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Contact (User Office)

 

Karlsruhe Nano Micro Facility
KIT-Campus North

Building 440

H.-von-Helmholtz-Platz 1

76344 Eggenstein-Leopoldshafen, Germany

 

phone: +49(721)608-23123

fax: +49(721)608-26273

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User Office

KNMF Profile

Benefit from unique technologies and leading expertise

Explore our competences for advanced multimaterial micro and nanotechnologies.

The Karlsruhe Nano Micro Facility (KNMF) offers a dedicated set of state-of-the-art technologies for structuring and characterising a multitude of functional materials at the micro- and nanoscale.

KNMF unifies 25 technology clusters and 52 scientists (in 2016). With an additional technology investment budget of 23.3 Mio. Euro, allocated by the Helmholtz Association of German Research Centers (HGF), regular updates and major investments are subject to a continuous improvement of both, the value of the facility and the welfare of its users. Our technology experts support all users in all questions relating to the access and use of our technologies. They will serve as local contacts and accompany you to reach your personal goals. This may include conducting processes at the laboratories or organising overall workflows for your own project. It is recommended to select and contact the experts of the technologies of interest prior to a proposal submission. The user office will assist you to find the most appropriate experts.

KNMF Laboratory for Micro- and Nanostructuring

» 3D Direct Laser Writing (3D-DLW)
» Atomic Layer Deposition (ALD)
» Deep X-ray Lithography (XRL)
» Dip-Pen Nanolithography (DPN) & Polymer Pen Lithography
» Direct Laser Writing (DLW)
» Dry Etching Cluster (DRIE)
» Electron Beam Lithography (EBL)
» Focused Ion Beam (FIB)
» Hot Embossing (HE)
» Injection Moulding (IM)
» Laser Material Processing (LMP)
» Surface-Anchored Metal-Organic Frameworks (SURMOFs)
» Thin Film Technologies (TFT)

KNMF Laboratory for Microscopy and Spectroscopy

» 3D Atom Probe Tomography (APT)
» Atomic Force Microscopy (AFM)
» Auger Electron Spectroscopy (AES)
» Bulk and Trace Analysis (BTA) of Nanomaterials
» Helium Ion Microscope (HIM)
» Single Crystal X-ray Diffraction (SCXD)
» Soft X-ray Spectroscopy, Microscopy, and Spectromicroscopy (WERA)
» Thin Film Characterisation (TFC) Methods
» Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
» Transmission Electron Microscopy (TEM)
» Travelling Wave Ion-Mobility Time-of-Flight Mass Spectrometry (ESI-/MALDI-TOF)
» X-Ray Photoelectron Spectroscopy (XPS)

 

Download the KNMF Instrumentation Book